- Home
- Products
-
Services
- Custom Synthesis
- 2D Material Modification Services
-
2D Material Testing Services
- 2D Material Surface Characterization
- 2D Material Structure Characterization
- 2D Materials Electrical Characterization Research
- Thermal Test of 2D Materials
- 2D Materials Optoelectronics Research
- Mechanical Testing of 2D Materials
- 2D Magnetic Materials Characterization
- CHNSO Elemental Analysis for 2D Materials
- Atomic Force Microscope for 2D Materials
- Transmission Electron Microscope for 2D Materials
- Scanning Electron Microscope for 2D Materials
- Fourier Transform Infrared Spectroscopy for 2D Materials
- Nuclear Magnetic Resonance Spectroscopy for 2D Materials
- X-Ray Photoelectron Spectroscopy for 2D Materials
- X-ray Diffraction for 2D Materials
- Raman Scattering for 2D Materials
- Scanning Probe Techniques for 2D Materials
- X-Ray Fluorescence for 2D Materials
- BET Specific Surface Area Analysis for 2D Materials
- ICP-OES and ICP-MS Analysis for 2D Materials
- Auger Electron Spectroscopy for 2D Materials
- Photoluminescence Spectroscopy for 2D Materials
- Surface Profiler for 2D Materials
- 2D Material Simulation Computing Service
- Thin Film Deposition Services
- Recommendation
-
Platforms
- Testing Technology Platform
-
Thin Film Process Technology Platform
- Plasma-Enhanced Chemical Vapor Deposition (PECVD) System
- Inductively Coupled Plasma Chemical Vapor Deposition (ICPCVD) System
- Low-Pressure Chemical Vapor Deposition (LPCVD) System
- Electron Beam Evaporation System
- Atomic Layer Deposition (ALD) System 01 (Oxide Thin Films)
- Atomic Layer Deposition (ALD) System 02 (Nitride Thin Films)
- Dielectric Magnetron Sputtering System
- Metal Magnetron Sputtering System
- Applications
- Resources
- Contact Us
- About Us
