The peculiar structure-property correlations that exist between changes in surface topography and mechanical response, electronic structure, optical characteristics, and electrochemical properties give two-dimensional (2D) materials their distinct behavior. These connections are frequently complex and susceptible to external and environmental factors. As a result, techniques like atomic force microscopy, which can offer multidimensional information in a controlled setting, are needed to characterize these systems (AFM).
Alfa Chemistry provides AFM testing services to characterize the surface topography of 2D materials, which is important for understanding the principles of 2D material functionality. Please contact us as soon as possible so we can assist you with your testing!
Why AFM
AFM is commonly used to capture 3D morphological pictures of 2D material sample surfaces. It can recognize single-atom steps and ripples in the x-direction and resolve lattice orientation and surface defects in the xy-plane with atomic resolution. Researchers have developed novel modes for reliable control of ultra-low imaging forces, which safeguard AFM tips and fragile samples, in addition to the traditional contact and tap modes. These modes also allow precise local stresses to be applied to the sample for mechanical, electromechanical and piezoelectric studies.
Fig 1. Schematic representation of an AFM. (Zhang H, et al. 2018)
Advanced AFM modes allow researchers to acquire maps of modulus, adhesion, deformation, conductivity, surface potential, dielectric constant, optical absorption and reflection, electrochemistry, and more, in addition to morphology and local force control. This data is often acquired via multimodal imaging at normal or high acquisition rates, allowing for correlation between multiple attributes.
In addition, AFM can work not only under ambient conditions, but also in controlled environments, including liquids, variable temperatures, desiccators, vacuum, etc. All these functions are contained in one instrument, making the AFM a versatile platform for studying highly multidisciplinary research. As a result, the AFM stands out among other 2D materials research techniques.
Service Detail
| Testing Services | Atomic Force Microscopy (AFM) |
| Test Content | Morphology, PFM, EFM, KPFM, MFMC-AFM/PeakForce TUNA |
| Sample Type | Powder / Film / Bulk |
| Instrument Model | Bruker Dimension Edge AFM, Bruker Dimension ICON AFM, Agilent 5500 AFM, NT-MDT Prima AFM |
| Lead Time | 2~3 Weeks |
Our requirements for samples are as follows:
Length/Width: 0.5 ~ 3 cm;
Thickness: 0.1 ~ 1 cm;
Surface Roughness: < 5 μm;
Please mark the test surface carefully.
- For powder series samples
| Powder Series Type | Required weight per sample |
| Powder | ≥ 20 mg, particle size < 5 μm |
| Powder in solvent | ≥ 1 mL |
| Powder prepared on silicon wafer | Length/width 0.5 ~ 3 cm |
| Instructions for powder sample preparation | Disperse the powder in a solvent (usually ethanol or deionized water) and drop it on the mica/silicon wafer for drying. |
Note: All samples are non-returnable, please contact us if you have any special requirements.
Our Scanning Probe Microscopy (SPM) uses nanometer-sized probes to scan the surface of 2D samples to create images of their topology and local properties. Our surface analysis technology employs X-ray photoelectron spectroscopy and a variety of other spectroscopic techniques to deliver high sensitivity and high resolution chemical composition and chemical shift analyses, as well as unprecedented automation and sample handling capabilities. In addition, we generate energy-level maps of 2D materials using surface-sensitive techniques such as inverse photoelectron spectroscopy (IPES) and ultraviolet photoelectron spectroscopy (UPS).
Reference
- Zhang H, et al. (2018). "Atomic Force Microscopy for Two-Dimensional Materials: A Tutorial Review." Optics Communications. 406: 3-17.
Please kindly note that our products are for research use only.
