2D Thin Films

Bi2Se3 Thin Film on Sapphire Substrate

Cat Number: ACM12068698-5

Cas number: 12068-69-8

Dimension: The sustrate size is 10mm*10mm, film covers the full area.

Purity: 99.9999% (6N)

Characterization Methods: Raman, photoluminescence, TEM, EDS

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Full Area Coverage PdS2 Layers on Sapphire

Cat Number: ACM12137756

Cas number: 12137-75-6

Dimension: 1cm x 1cm square shaped

Purity: 99.9995% purity

Characterization Methods: Raman, photoluminescence, TEM, EDS

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PdSe2 Thin Film on SiO2/Si Substrate

Cat Number: ACM12137767-2

Cas number: 12137-76-7

Dimension: 10 * 10mm

Purity: 99.9999% (6N)

Characterization Methods: Raman, photoluminescence, TEM, EDS

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PdSe2 Thin Film on Sappire Substrate

Cat Number: ACM12137767-1

Cas number: 12137-76-7

Dimension: 10 * 10mm

Purity: 99.9999% (6N)

Characterization Methods: Raman, photoluminescence, TEM, EDS

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PdSe2 Thin Film on Quartz Substrate

Cat Number: ACM12137767

Cas number: 12137-76-7

Dimension: 10 * 10mm

Purity: 99.9999% (6N)

Characterization Methods: Raman, photoluminescence, TEM, EDS

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Tungsten Disulfide(WS2) Monolayer Film

Cat Number: ACM12138099-53

Cas number: 12138-09-9

Synonyms: Tungsten sulphide, Tungsten sulfide, Tungsten (IV) sulfide

Dimension: 1 cm × 1 cm or custom-made sizes

Purity: > 99%

Molecular Weight: 247.97 g/mol

Characterization Methods: microscopic analysis, photoluminescence, and Raman spectroscopy studies

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Tungsten Disulfide(WS2) Few-Layer Film

Cat Number: ACM12138099-52

Cas number: 12138-09-9

Synonyms: Tungsten sulphide, Tungsten sulfide, Tungsten (IV) sulfide

Dimension: 1 cm × 1 cm or custom-made sizes

Purity: > 99%

Molecular Weight: 247.97 g/mol

Characterization Methods: microscopic analysis, photoluminescence, and Raman spectroscopy studies

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CVD WS2 Isolated Grains

Cat Number: ACM12138099-51

Cas number: 12138-09-9

Dimension: 10*10mm, 15*15mm, 20*20mm, 2 inch disc, 4 inch disc or customized size specified by the customer.

Purity: 99.9999% (6N)

Characterization Methods: Raman, photoluminescence, TEM, EDS

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CVD WS2 Continuous Film

Cat Number: ACM12138099-50

Cas number: 12138-09-9

Dimension: 10*10mm, 15*15mm, 20*20mm, 2 inch disc, 4 inch disc or customized size specified by the customer.

Purity: 99.9999% (6N)

Characterization Methods: Raman, photoluminescence, TEM, EDS

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Isolated Nickel Telluride Grains

Cat Number: ACM12142880-1

Cas number: 12142-88-0

Dimension: 10*10mm, 15*15mm, 20*20mm, 2 inch disc, 4 inch disc or customized size specified by the customer.

Purity: 99.9999% (6N)

Characterization Methods: Raman, photoluminescence, TEM, EDS

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Bi2Te3 Thin Film on Sapphire Substrate

Cat Number: ACM1304821-16

Cas number: 1304-82-1

Dimension: The sustrate size is 10mm*10mm, film covers the full area.

Purity: 99.9999% (6N)

Characterization Methods: Raman, photoluminescence, TEM, EDS

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SnS2 Thin Film on Sapphire Substrate

Cat Number: ACM1315011-3

Cas number: 1315-01-1

Dimension: The sustrate size is 10mm*10mm, film covers the full area.

Purity: 99.9999% (6N)

Characterization Methods: Raman, photoluminescence, TEM, EDS

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Sb2Te3 Thin Film

Cat Number: ACM1327500-4

Cas number: 1327-50-0

Dimension: 10mm*10mm

Purity: 99.9999% (6N)

Characterization Methods: Raman, photoluminescence, TEM, EDS

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SnSe2 Thin Film on Sapphire Substrate

Cat Number: ACM207700961

Cas number: 20770-09-6-1

Dimension: The sustrate size is 10mm*10mm, SnSe2 film covers the full area.

Purity: 99.9999% (6N)

Characterization Methods: Raman, photoluminescence, TEM, EDS

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CVD Diamond on Silicon

Cat Number: ACM7782403-13

Cas number: 7782-40-3

Dimension: 4 mm x 1 mm x 0.1 mm in size

Purity: 99.9999% (6N)

Characterization Methods: PL, SEM,EDS, transmission spectrum

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V1 Grade 2D Material Substrate

Cat Number: ACMA00022992

Characterization Methods: Raman spectroscopy, RBS, XPS, and SIMS.

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Trivial Transfer Hexagonal Boron Nitride

Cat Number: ACMA00025001

Dimension: 1 cm*1 cm, 2.5 cm*1 cm

Purity: (6N) 99.9999% confirmed

Molecular Weight: 24.82 g/mol

Characterization Methods: XRD, XPS, AES, SIM, and HRTEM

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SnS Multilayer Single Crystal Grain Thin Film

Cat Number: ACMA00025000

Dimension: The sustrate size is 10mm*10mm, film covers the full area.

Purity: 99.9999% (6N)

Characterization Methods: Raman, angle resolved Raman spectroscopy, photoluminescence, absorption spectroscopy TEM, EDS

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SnS Multilayer Continuous Film

Cat Number: ACMA00024999

Dimension: The sustrate size is 10mm*10mm, film covers the full area.

Purity: 99.9999% (6N)

Characterization Methods: Raman, angle resolved Raman spectroscopy, photoluminescence, absorption spectroscopy TEM, EDS

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Nickel Ditelluride(NiTe2) Isolated Grain Thin Film

Cat Number: ACMA00024998

Dimension: The sustrate size is 10mm*10mm, film covers the full area.

Purity: 99.9999% (6N)

Characterization Methods: Raman, angle resolved Raman spectroscopy, photoluminescence, absorption spectroscopy TEM, EDS

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