- 2D Crystal Materials
- 2D CVD Materials
-
2D MAXENE MXENE
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MAXenes
- (Mo2/3Sc1/3)2AlC MAX
- (Mo2/3Y1/3)2AlC MAX
- (W2/3Sc1/3)2AlC MAX
- (W2/3Y1/3)2AlC MAX
- Cr2AlC MAX
- Cr2TiAlC3 MAX
- High Entropy MAX
- MAX Target Material
- Mn2AlC MAX
- Mo2Ga2C MAX
- Mo2Ti2AlC MAX
- Mo2Ti2AlC3 MAX
- Mo2TiAlC2 MAX
- Mo3AlC2 MAX
- MoAlB MAX
- Nb2AlC MAX
- Nb4AlC3 MAX
- ScAl3C3 MAX
- Ta2AlC MAX
- Ta4AlC3 MAX
- Ti2AlC MAX
- Ti2AlN MAX
- Ti2SnC MAX
- Ti2VAlC2 MAX
- Ti3Al0.5Cu0.5C2 MAX
- Ti3AlC2 MAX
- Ti3AlCN MAX
- Ti3GeC2 MAX
- Ti3SiC2 MAX
- Ti3SnC2 MAX
- Ti4AlN3 MAX
- TiNbAlC MAX
- TiVAlC MAX
- V2AlC MAX
- V2AlN MAX
- V2GaC MAX
- V2GeC MAX
- V2PC MAX
- V2ZnC MAX
- V4AlC3 MAX
- VCrAIC MAX
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MXenes
- Amino Carboxylated MXene
- Cr2C MXene
- Element Doping MXene
- Foam Metal Load MXene
- High Entropy MXene
- In-situ Doped MXene
- Mo1.33C MXene
- Mo2C MXene
- Mo2Ti2C2 Mxene
- Mo2Ti2C3 Mxene
- MXene Film and Heterojunction
- MXene Functional Group Regulation
- MXene Loaded Metal
- Mxene Nanowire
- MXene Quantum Dots
- Nb2C MXene
- Nb4C3 MXene
- Other MXene Products
- Porous MXene
- Single Atom Doped MXene
- Solid Solution Phase MXene
- Ta2C MXene
- Ta4C3 MXene
- Ti2C MXene
- Ti2N Mxene
- Ti3C2 MXene
- Ti3CN MXene
- Ti4N3 MXene
- TiNbC MXene
- TiVC MXene
- V2C MXene
- V4C3 MXene
- VCrC MXene
- W1.33C MXene
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MAXenes
- 3D Quantum Crystals
- MBene 2D Transition Metal Borides
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Other 2D Products
- 2D Carbon-Based
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2D Material Fiber/Film
- 3D Graphene Powder Series
- Boron Nitride Material
- Boron Nitride Nano Series
- Electrospun Carbon Nanofiber Series
- Electrospun Inorganic Nanofibers Series
- Electrospun Nanofiber Membrane Series
- Electrospun Polymer Nanofiber Membrane
- Electrospun SiC Nanofiber Membrane
- Lithium Ion/Fuel Cell Series
- Porous Metal Film Series
- Surface Graphene Structure Carbon Material Series
- Vertical Graphene Composite Carbon Material
- High Performance Battery Materials
- Other Liquid Products
- Other Powder/Crystal Products
- Perovskite Materials
- Porous materials MOF, COF
2D Thin Films
Bi2Se3 Thin Film on Sapphire Substrate
Cat Number: ACM12068698-5
Cas number: 12068-69-8
Dimension: The sustrate size is 10mm*10mm, film covers the full area.
Purity: 99.9999% (6N)
Characterization Methods: Raman, photoluminescence, TEM, EDS
Full Area Coverage PdS2 Layers on Sapphire
Cat Number: ACM12137756
Cas number: 12137-75-6
Dimension: 1cm x 1cm square shaped
Purity: 99.9995% purity
Characterization Methods: Raman, photoluminescence, TEM, EDS
PdSe2 Thin Film on Quartz Substrate
Cat Number: ACM12137767
Cas number: 12137-76-7
Dimension: 10 * 10mm
Purity: 99.9999% (6N)
Characterization Methods: Raman, photoluminescence, TEM, EDS
PdSe2 Thin Film on Sappire Substrate
Cat Number: ACM12137767-1
Cas number: 12137-76-7
Dimension: 10 * 10mm
Purity: 99.9999% (6N)
Characterization Methods: Raman, photoluminescence, TEM, EDS
PdSe2 Thin Film on SiO2/Si Substrate
Cat Number: ACM12137767-2
Cas number: 12137-76-7
Dimension: 10 * 10mm
Purity: 99.9999% (6N)
Characterization Methods: Raman, photoluminescence, TEM, EDS
CVD WS2 Continuous Film
Cat Number: ACM12138099-50
Cas number: 12138-09-9
Dimension: 10*10mm, 15*15mm, 20*20mm, 2 inch disc, 4 inch disc or customized size specified by the customer.
Purity: 99.9999% (6N)
Characterization Methods: Raman, photoluminescence, TEM, EDS
CVD WS2 Isolated Grains
Cat Number: ACM12138099-51
Cas number: 12138-09-9
Dimension: 10*10mm, 15*15mm, 20*20mm, 2 inch disc, 4 inch disc or customized size specified by the customer.
Purity: 99.9999% (6N)
Characterization Methods: Raman, photoluminescence, TEM, EDS
Tungsten Disulfide(WS2) Few-Layer Film
Cat Number: ACM12138099-52
Cas number: 12138-09-9
Synonyms: Tungsten sulphide, Tungsten sulfide, Tungsten (IV) sulfide
Dimension: 1 cm × 1 cm or custom-made sizes
Purity: > 99%
Molecular Weight: 247.97 g/mol
Characterization Methods: microscopic analysis, photoluminescence, and Raman spectroscopy studies
Tungsten Disulfide(WS2) Monolayer Film
Cat Number: ACM12138099-53
Cas number: 12138-09-9
Synonyms: Tungsten sulphide, Tungsten sulfide, Tungsten (IV) sulfide
Dimension: 1 cm × 1 cm or custom-made sizes
Purity: > 99%
Molecular Weight: 247.97 g/mol
Characterization Methods: microscopic analysis, photoluminescence, and Raman spectroscopy studies
Isolated Nickel Telluride Grains
Cat Number: ACM12142880-1
Cas number: 12142-88-0
Dimension: 10*10mm, 15*15mm, 20*20mm, 2 inch disc, 4 inch disc or customized size specified by the customer.
Purity: 99.9999% (6N)
Characterization Methods: Raman, photoluminescence, TEM, EDS
Bi2Te3 Thin Film on Sapphire Substrate
Cat Number: ACM1304821-16
Cas number: 1304-82-1
Dimension: The sustrate size is 10mm*10mm, film covers the full area.
Purity: 99.9999% (6N)
Characterization Methods: Raman, photoluminescence, TEM, EDS
SnS2 Thin Film on Sapphire Substrate
Cat Number: ACM1315011-3
Cas number: 1315-01-1
Dimension: The sustrate size is 10mm*10mm, film covers the full area.
Purity: 99.9999% (6N)
Characterization Methods: Raman, photoluminescence, TEM, EDS
Sb2Te3 Thin Film
Cat Number: ACM1327500-4
Cas number: 1327-50-0
Dimension: 10mm*10mm
Purity: 99.9999% (6N)
Characterization Methods: Raman, photoluminescence, TEM, EDS
SnSe2 Thin Film on Sapphire Substrate
Cat Number: ACM207700961
Cas number: 20770-09-6-1
Dimension: The sustrate size is 10mm*10mm, SnSe2 film covers the full area.
Purity: 99.9999% (6N)
Characterization Methods: Raman, photoluminescence, TEM, EDS
CVD Diamond on Silicon
Cat Number: ACM7782403-13
Cas number: 7782-40-3
Dimension: 4 mm x 1 mm x 0.1 mm in size
Purity: 99.9999% (6N)
Characterization Methods: PL, SEM,EDS, transmission spectrum
CVD Method Monolayer WS2
Cat Number: ACMA00018420
Dimension: 9 mm*9 mm
Purity: (6N) 99.9999% confirmed
Molecular Weight: 247.98 g/mol
Characterization Methods: XRD, XPS, AES, SIM, and HRTEM
CVD Method Monolayer WSe2
Cat Number: ACMA00018421
Synonyms: Tungsten selenide, Tungsten diselenide, Tungsten (IV) selenide
Dimension: 9 mm*9 mm
Purity: (6N) 99.9999% confirmed
Molecular Weight: 341.76 g/mol
Characterization Methods: XRD, XPS, AES, SIM, and HRTEM
2'' Wafer CVD Monolayers or Few-Layers
Cat Number: ACMA00022991
Dimension: 2''
Purity: 99.9999% confirmed purity
Characterization Methods: XRD, XPS, AES, SIM, and HRTEM
V1 Grade 2D Material Substrate
Cat Number: ACMA00022992
Characterization Methods: Raman spectroscopy, RBS, XPS, and SIMS.
Bismuth Oxyselenium (Bi2O2Se) Thin Film
Cat Number: ACMA00024993
Dimension: The sustrate size is 10mm*10mm, film covers the full area.
Purity: 99.9999% (6N)
Characterization Methods: Raman, angle resolved Raman spectroscopy, photoluminescence, absorption spectroscopy TEM, EDS
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